TT-30 ELLIPSOMETER
The TT-30 Ellipsometer is unique in its performance accuracy and price. It is designed for measurement of reactive index thickness of single and multi layer films.
Details
TT-60 ELLIPSOMETER
TT-60 ellipsometer is the direct result of substention advanced in state of the art technology and economy. Different wavelengths is available from VIS or NIR range user can measure their samples less than 1 sec with excellent accuracy.
DetailsTT-90 ELLIPSOMETER
The TT-90 spectroscopic Ellipsometer accurately measures thickness and refractive index of single or multi layer sample. The TT-90 spectroscopic Ellipsometer is unique in its performance accuracy and price.
DetailsTT-110 ELLIPSOMETER
TT-110 ellipsometer provides accurate results for variable angle reflection and also for all polarization stages by rotating polarizer.
DetailsTT-120 ELLIPSOMETER
TT-120 provides world performance and wide range for the users. It is designed in UV/VIS 250-1100 nm or NIR (700-1700 nm ) or (700-2300 nm) ranges. TT-120 also has Transmission and Variable Angle Reflection Function.
DetailsMethod
Ellipsometry, is a method which informes dielectric properties of the sample by using polarised light. Polarized light falls onto the surface of the sample and that provides the optical interactions about the examined system. The interaction, effects the light which has known polarity and required angle of incidence. The system effects the polarity of the light as optical changes are present within the system. Hence, it is resulted as reflection or diffraction of the light through the layers.
Applications
Physical properties of organic and inorganic layers are designated, metal-nonmetal coated film layers are analysed by using ellipsometer. During the application, the structure and conformation of the sample remain constant. In-situ applications are feasible, hence, formation of film layer and kinetics of the formation can be examined.
Use
Through the years, technical and teoretical uses of ellipsometry resulted with sensitive mesurement and accurate results without any defect on the sample.
Ellipsometer probes the optical properties and thickness of layers. Formation of surface regularity and interface properties are additional uses of ellipsometer.